Visualizing and measuring thin-film thickness at the nanoscale during dynamic evolution has long been a long-standing challenge. A joint-imaging method and its innovative procedure for combining digital holography (DH) and white light colorimetric interferometry (WLCI) measurement data are presented in a single intelligent tool.
The method enables a comprehensive quantitative study of the dynamic evolution of freestanding thin films over a large area with high spatial resolution and full-field modality. It is possible to overcome the lack of digital holography in thickness measurements of ultrathin layers by combining interferometric and holographic fringes, providing a reliable reference for full-field quantitative mapping of the entire film with interferometric accuracy.
The digital holography and white light colorimetric interferometry tool provide an in situ, continuous monitoring of film formation and dynamic evolution without limits of thickness range and in full-field mode, paving the way for a deeper understanding of the physics behind the behavior of freestanding thin liquid films. This can be crucial in many fields of application, including fluids, polymers, biotechnology, bottom-up fabrication, etc.
The proposed method has a high measurement sensitivity for changes in film thickness, allowing for quantitative analysis of film thickness mapping in the full FOV.
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